测试需求             

   1.按键通断测试

    2.静动态电流测试

    3.红外测试

    4.电阻测量

    5.I2C测试


 

测试方案

   
Test step
Test name
Procedure
1
Flex connect
Mate flex to test fixture via ZIF connector.
2
Open/Short test
Check impedance between each pin and ensure there are no shorts.
3
Receiver Check
Check connectivity between RCVR_N of the connector and the gold-plated receiver (less than 1 ohm).  Repeat for RCVR_P.
4
Quiescent Currents
Apply 3V to PROX_VDD, PROX_EN, and LED_PWR.
Check that LED_PWR current is less than 1uA.
Check that PROX_VDD current is between 300uA and 1.5mA.
5
Proximity Transmit Power
Excite pin 3 (PROX_TX) with a 10% duty cycle, 0-3V 100KHz square wave.
Check that the LED_PWR current is between 8 and 15mA.
6
Proximity Transmit and Receive Test
Put a Kodak 18% gray card 10mm above the DUT.  PROX_TX should be GND.  On PROX_RX, the voltage should be between 1.4V and 1.6V.
Excite the PROX_TX line with 28 pulses at 3Vpk 0V offset 2.5us width.  Capture the waveform on pin 11 PROX_RX. Check on PROX_RX for 28 2.5us pulses, with a peak-to-peak voltage > 100 mV. 

7
ALS Connectivity Test
Verify I2C connection to ALS (at device address 0x44H). 
Write to the command register (at register 0x00H) the value 0x80 (enable ADC core). Read from sensor register (at register 0x05) for the result.
The result should NOT be 0x00H or 0xFFH.
8
ALS Interrupt Test
Connect a 100K resistor between pin 8 (INT*) and PROX_VDD.
Cover up the photosensitive area of the ALS chip.
Clear the interrupt by reading one byte from register 0x40. 
Confirm that the INT* line is above 2.5V.
Set the HI interrupt threshold (at register 0x02H) to HIGH_INT_THRESH.
Uncover the photosensitive area.
Confirm that the INT* line is below <0.5V.

   

   

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